Burn-in Test Socket
https://www.rubberinterposer.com/products/burn-in-test-socket/
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Burn-in Test Socket
The Burn-in Test Socket is a critical component used in semiconductor testing to assess the reliability and durability of integrated circuits (ICs) over extended periods. It facilitates the application of stress tests, including elevated temperatures and voltage levels, to identify potential failures and ensure the quality of ICs before deployment.

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